CAT Benchtop Probe System

The Benchtop Probe System provides a standardized method to measure, track, and improve printed circuit board manufacturing process capability and quality.  Results from the analysis of CAT test patterns and coupons provide quantitative yield and uniformity data that illustrate strengths and weaknesses of processes, and point to areas requiring improvement or development.  Furthermore, the data offers insight into the sources of defects and process non-uniformities, allowing for their reduction or elimination.

Configured for the following test patterns and coupons:

1. IPC PCQR² Revision D designs
   

2. CAT Conductor and space designs
   

3. HATS coupons
   

More Information:

1. Brochure
   

2. Example Reports
   

3. Request a Quotation
   

Highly Accelerated Thermal Shock (HATS) System

The HATS System is a time-efficient and cost-effective thermal shock reliability test method based on traditional air-to-air thermal cycling.  The system uses a single chamber in which high volume hot and cold air alternately pass stationary samples, providing rapid thermal transfer and reducing the time for the samples to reach temperature equilibrium.  The samples are fixtured to a high-speed precision resistance sampling network, allowing continuous monitoring of the samples during the temperature cycles.  For more information, visit www.hats-tester.com.

More Information:

1. Brochure
   

2. Example Report
   

3. Request a Quotation